Device Characterization Sockets Tecknit IDS test sockets are designed for use in internal diagnostic test systems, specifically for electron beam probing.

Final Test Sockets Tecknit contactors are are utilized for final test applications to ensure defect-free device performance, and are available in both hand test and automated handler test applications.

Production Sockets Tecknit production sockets eliminate soldering of IC devices on final system performance evaluations and on production boards. Simple installation and removal of IC devices allows for easy device replacement or upgrade.

Custom Interconnects Fuzz Button Interconnects can be designed and customized to replace almost any existing interconnection scheme. Available in a wide variety of dielectric carriers and wire materials, Fuzz Buttons are proving their versatility. Military, space, radar, etc. Custom Fuzz Buttons are available to provide high performance interconnection solutions.

High Performance Customized Solutions Tecknit Fuzz Buttons and hardhat contact pins can be customized and designed to meet the most demanding interconnection needs. Fuzz Button contacts provide superior electrical performance characteristics, including high current carrying capability, low resistance and low impedance. In addition, Tecknit Fuzz Buttons adapt ideally to limited space applications. Whether designed for test, production, or sophisticated coaxial applications, Tecknit Fuzz Button products offer durability and repeatabilty with virtually "invisible" interconnection.